Home > Products > IEC & UL Test Finger Probe > IEC60884-1 1N & 20N Test Probes for socket-outlet no-accessibility of live parts test gauges through shutters
IEC60884-1 1N & 20N Test Probes for socket-outlet no-accessibility of live parts test gauges through shutters
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Product Details
Brand Name | Pego | Place of Origin | China | |
Model Number | PG-TP884 | Power | Other, None | |
Usage | Universal Testing Machine |
Product Description
IEC60884-1 1N & 20N Test Probes for socket-outlet no-accessibility of live parts test gauges through shutters
1. Introduction:
The probes are designed according to IEC60884-1 figure 9 and figure 10. 20N test probe is for checking non-accessibility live part through shutters, 1N test probe is for checking non-accessibility live part through shutters and live parts of socket-outlets with increased protection.
2. Specification:
20N Push force | Rigid steel wire | Diameter: 3+0.03mm, length: 80±0.5mm |
Tip of rigid steel wire | R0.2+0.05 | |
1N Push Force | Rigid steel wire | Diameter: 1+0.015mm, length: 80±0.5mm |
Tip of rigid steel wire | R0.05 |
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